User manual TEKTRONIX TDS 700D

[. . . ] User Manual TDS 500D, TDS 600B & TDS 700D Digitizing Oscilloscopes 071-0130-03 This document applies for firmware version 1. 0 and above. Copyright E Tektronix, Inc. Licensed software products are owned by Tektronix or its suppliers and are protected by United States copyright laws and international treaty provisions. Use, duplication, or disclosure by the Government is subject to restrictions as set forth in subparagraph (c)(1)(ii) of the Rights in Technical Data and Computer Software clause at DFARS 252. 227-7013, or subparagraphs (c)(1) and (2) of the Commercial Computer Software ­ Restricted Rights clause at FAR 52. 227-19, as applicable. Information in this publication supercedes that in all previously published material. [. . . ] The high value less the low value measured over the entire waveform or gated region. Amplitude = High ­ Low Area Cycle Area Voltage over time measurement. Area measured above ground is positive; area below ground is negative. The area over the first cycle in the waveform, or the first cycle in the gated region, in volt-seconds. Area measured above ground is positive; area below ground is negative. The arithmetic mean over the first cycle in the waveform or the first cycle in the gated region. Burst Width Cycle Mean 3­126 TDS 500D, TDS 600B, & TDS 700D User Manual Measuring Waveforms Table 3­11: Measurement definitions (cont. ) Name Cycle RMS Delay Fall Time Definition Voltage measurement. The true Root Mean Square voltage over the first cycle in the waveform or the first cycle in the gated region. The time between the MidRef crossings of two different traces or the gated region of the traces. Time taken for the falling edge of the first pulse in the waveform or gated region to fall from a High Ref value (default = 90%) to a Low Ref value (default =10%) of its final value. Timing measurement for the first cycle in the waveform or gated region. The value used as 100% whenever High Ref, Mid Ref, and Low Ref values are needed (as in fall time and rise time measurements). The histogram method uses the most common value found above the mid point. The value used as 0% whenever High Ref, Mid Ref, and Low Ref values are needed (as in fall time and rise time measurements). With the histogram method, it refers to the most common value found below the midpoint. Timing measurement of the first cycle in the waveform or gated region. The ratio of the negative pulse width to the signal period expressed as a percentage. NegativeDutyCycle + NegativeOvershoot + Low * Min Amplitude Negative Width Peak to Peak 100% Frequency High Low Maximum Mean Minimum Negative Duty Cycle Negative Overshoot Timing measurement of the first pulse in the waveform or gated region. The distance (time) between MidRef (default 50%) amplitude points of a negative pulse. The absolute difference between the maximum and minimum amplitude in the entire waveform or gated region. TDS 500D, TDS 600B, & TDS 700D User Manual 3­127 Measuring Waveforms Table 3­11: Measurement definitions (cont. ) Name Phase Period Positive Duty Cycle Definition Timing measurement. Time it takes for the first complete signal cycle to happen in the waveform or gated region. Timing measurement of the first cycle in the waveform or gated region. The ratio of the positive pulse width to the signal period expressed as a percentage. [. . . ] Slew Rate trigger A mode in which the oscilloscope triggers based on how fast a pulse edge traverses (slews) between an upper and lower threshold. The oscilloscope can trigger on slew rates faster or slower than a user-specified rate. You can calculate the direction by computing the sign of the ratio of change in the vertical quantity (Y) to the change in the horizontal quantity. Tek Secure This feature erases all waveform and setup memory locations (setup memories are replaced with the factory setup). [. . . ]